IEC 61987-41 ED1Generic structures of List of Properties (LOP) of Process Analyzer Technology (PAT) measuring devices for electronic data exchange

Under development

ICT rolling plan topic: Edge Computing

SDO: IEC

Latest publishied version: https://www.iec.ch/ords/f?p=103:38:401030832849310::::FSP_ORG_ID,FSP_APEX_PAGE,FSP_PROJECT_ID:1452,23,107355